Image of the Week - October 22, 2002

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AFM of FIB Deposited Pt

Focused Ion Beam assisted Pt deposition on Si by varying the dwell time of the beam on individual pixels on a pattern created in Adobe Illustrator

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Contact: schttpdh@uiuc.edu

Uploaded Tue Oct 22 10:43:09 2002 by Glenn A. Fried

Updated Tue Jan 26 22:38:05 2010 by Daniel E. Weber