Image of the Week - February 18, 2003
Direct Focused Ion Beam Deposition of Pt
The image at left illustrates the results of Focused Ion Beam (FIB) induced deposition of Pt. This experiment was carried out in the Center for Microanalysis of Materials at MRL, UIUC. The image at right is a frame from an animation which depicts this nanofabrication technique. The animation was produced in the Visualization, Media and Imaging Laboratory using Maya.
Image Courtesy:
- Dr. Lolita Rotkina - Beckman Institute Fellow
- Carl Burton - ITG, Beckman Institute
Contact: rotkina@uiuc.edu, burton1@uiuc.edu
Copyright © Imaging Technology Group; Beckman Institute; and the University of Illinois. All rights reserved. The Image of the Week may not be reproduced without the prior permission of the Imaging Technology Group or the individual image authors.
Uploaded Tue Feb 18 10:47:17 2003 by Benjamin Grosser
Updated Wed Jan 27 23:57:38 2010 by Daniel E. Weber