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Tomogram Obtained by Transmission Electron Tomography of Dislocation Structures

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Created 09/28/2010

Top: views from a tomogram reconstructed using bright-field high-voltage electron microscopy (HVEM) images; bottom: views from the traced tomogram, where dislocations were colored according to their slip planes. The crack tip is depicted as a red surface, located middle-left in the volume.

Credits

  • Ian Robertson , Materials Science and Engineering
  • Kenji Higashida , Kyushu University, Japan
  • Stephen House , Materials Science and Engineering
  • Grace Liu , Materials Science and Engineering
  • Masaki Tanaka , Materials Science and Engineering
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