University of illinois Urbana-Champaign

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Carbon Fringe in the TEM

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Created 11/18/2003

This micrograph of carbon fringes at high magnification demonstrates the imaging capability of the CM200 TEM when the instrument is properly adjusted at its highest possible accelerating voltage. The micrograph was taken using the TVIPS 2k x 2k digital camera.


  • Brian Batzka , FEI Company
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