University of illinois Urbana-Champaign

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Direct Focused Ion Beam Deposition of Pt

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Created 02/18/2003

The image at left illustrates the results of Focused Ion Beam (FIB) induced deposition of Pt. This experiment was carried out in the Center for Microanalysis of Materials at MRL, UIUC. The image at right is a frame from an animation which depicts this nanofabrication technique. The animation was produced in the Visualization, Media and Imaging Laboratory using Maya.


  • Dr. Lolita Rotkina , Beckman Institute Fellow
  • Carl Burton , ITG, Beckman Institute
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