Image of the Week Gallery
High Strain Deformation of Flexible Integrated Circuit
Digital photograph captured by ITG staff Chas Conway in the Visualization Laboratory, highlighting the work of UIUC researchers John Rogers, Dae-Hyeong Kim, et al. The image reveals a bendable, stretchable integrated circuit under the stress of a pencil tip projected into the device. To capture the image, Conway constructed a custom device holder and an elaborate lighting setup using the Visualization Laboratory's macro-photography system.
- John A. Rogers , 3D Micro- and Nanosystems, Beckman Institute