Tomogram Obtained by Transmission Electron Tomography of Dislocation Structures

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Created 9/28/2010 5:00:00 AM

Top: views from a tomogram reconstructed using bright-field high-voltage electron microscopy (HVEM) images; bottom: views from the traced tomogram, where dislocations were colored according to their slip planes. The crack tip is depicted as a red surface, located middle-left in the volume.

Credits

• Ian Robertson , Materials Science and Engineering
• Kenji Higashida , Kyushu University, Japan
• Stephen House , Materials Science and Engineering
• Grace Liu , Materials Science and Engineering
• Masaki Tanaka , Materials Science and Engineering