Details
Environmental Scanning Electron Microscope
![ESEM2 ESEM2](https://itg.beckman.illinois.edu/images/default-source/microscopy-equipment/esem2.jpg?sfvrsn=3d9618db_2)
Field-Emission Environmental Scanning Electron Microscope (ESEM-FEG) with Energy-Dispersive Spectroscopy (EDS)
A versatile microscope with 2 nm ultimate resolution. Works well in both Hi-Vac mode (normal SEM) and Wet mode (as an ESEM). In Wet mode, the Peltier stage may be utilized to keep samples at 100% R.H. while they are being imaged.
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Features
- Everhart-Thornley secondary electron detector
- Robinson series 6 scintillator-type backscattered electron detector (BSD), plus solid-state low- and standard voltage BSDs
- Several different gaseous secondary electron detectors (GSEDs), from the LF (large-field) detector to the 0.5-mm-aperture detector
- EDAX light-element energy-dispersive spectroscopy (EDS)
- Peltier-effect heating/cooling stage (20µ C above/below ambient).
- 1000µ C hot stage
For additional information about this piece of equipment, see the Calendars, Contacts, and Fees pages.
Primary Contacts | |
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Secondary Contacts | |
Manufacturer | FEI Company |
Equipment Model | FEI Quanta FEG 450 ESEM |
Location | B606 L |
Phone Numbers | (217) 333-5493, (217) 265-5071, (217) 265-8164 (Room B606L) |